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|Place of Origin:||China Beijing|
|Certification:||CE / GOST|
|Minimum Order Quantity:||1piece|
|Packaging Details:||Standard export carton|
|Delivery Time:||after receiving payment|
|Payment Terms:||Western Union, T/T, Paypal|
|Supply Ability:||500 Unit/Units per Month|
|Measurement Range:||Z Axis(Vertical)320μm(Ra=80μm),X Axis(Horizontal)17.5mm||Resolution:||Z Axis(Vertical)0.01μm/±20μm,0.02μm/±40μm,0.04μm/±80μm,0.08μm/±160μm|
|Parameters:||Ra, Rq, Rz, Rt, Rp, Rv, RS, RSm, Rz(JIS), Ra, Rq, Rz, Rt, Rp, Rv, RS, RSm, Rz(JIS), Ry(JIS), RSk, R3||Filter:||RC,PC-RC,Gauss,D-P|
|Sampling Length(lr):||0.25,0.8,2.5mm||Assessment Length(ln):||Ln= Lr×n,n=1~5|
|Probe:||Differential Inductance.Ruby, Longitudinal Radius 40mm|
The MR200 surface roughness tester is a new upgrade instrument which adopts the newest processor. This instrument adopts 2.7 inch OLED display, combines accurate measurement, exquisite design, fast process rate and complete protection in one host. It is highly favored by users since it was produced, it has large measurement range, superior than other similar products and can meet different needs of users. By connecting with Micro-USB port, Bluetooth, SD card, it can do wireless remote control, measurement, print and communicate with PC and store massive data. It has been widely used in the quality control process of various precision metals, plays an important and necessary role in rising production qualification rate and saving cost.
This instrument adopts needle scanning method to test the surface roughness of the work piece.
When measuring roughness of part surface, the probe is placed on the surface of the part and then tracing the surface at constant rate. The probe acquires the surface roughness by the sharp stylus in probe. The roughness causes displacement of probe which results in change of inductive value of induction coils thus generate analogue signal which is in proportion to surface roughness at output end of phase-sensitive rectifier. This signal enters data collection system after amplification and level conversion. After that, those collected data are processed with digital filtering and parameter calculation by ARM chip and the measuring result can be read on OLED display. The results can be printed by Bluetooth printer.
Ambient temperature: -20℃～＋50℃;
Storage temperature: -30℃～＋70℃;
Relative humidity: ≤90％;
The surrounding environment should avoid of vibration, strong magnetic field, corrosive medium and heavy dust.
When the instrument shows abnormal phenomenon, such as no measurements, the liquid crystal abnormal display, larger error, the keyboard operation failure or malfunction confusion, please refer to the troubleshooting index table, exclude common failure. Please do not disassemble or adjust any fixed assembly parts, you should entrust to the company's after-sales service department for maintenance and disposal.
Measurement range: Z Axis(Vertical)320μm(Ra=80μm),X Axis(Horizontal)17.5mm
Resolution: Z Axis(Vertical)0.01μm/±20μm,0.02μm/±40μm,0.04μm/±80μm,0.08μm/±160μm
Parameters: Ra, Rq, Rz, Rt, Rp, Rv, RS, RSm, Rz(JIS), Ra, Rq, Rz, Rt, Rp, Rv, RS, RSm, Rz(JIS), Ry(JIS), RSk, R3
Sampling length(lr): 0.25,0.8,2.5mm